Title of Chapter/Section
The role of muons in semiconductor research (Ch 5)
Title of Book
Characterisation and Control of Defects in Semiconductors
Editor(s) of Book
Filip Tuomisto
Department
Physics
Document Type
Book Section/Chapter
Place of Publication
London
Publisher
Institution of Engineering and Technology (IET)
Year of Publication
2019
Page Range
199-261
Description
The aim of this chapter is to provide an introduction and overview of using muons to study defects in semiconductors for an audience with a background in material science. First is a general tutorial to relevant models and discussion of the muon-based techniques that have been important to the semiconductor field. The latter portion of this chapter highlights results from selected studies on semiconductors to demonstrate and describe some contributions that muon spin research (SR) techniques have made to the semiconductor community in recent years.
Recommended Citation
P.W. Mengyan. "The role of muons in semiconductor research" in "Characterisation and control of defects in semiconductors". ed. F. Tuomisto (IET: London, 2019). Hardcover ISBN 978-1-78561-655-6 .